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STEM SI Warp: A Tool for Correcting the Linear and Nonlinear Distortions for Atomically Resolved STEM Spectrum and Diffraction Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 132-133
- Print publication:
- August 2018
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Atomically Resolved EELS Elemental and Fine Structure Mapping via Multi-Frame and Energy-Offset Correction Acquisition
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 448-449
- Print publication:
- August 2018
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Polymeric Integrated Optics
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- Journal:
- MRS Online Proceedings Library Archive / Volume 244 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 253
- Print publication:
- 1991
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